Nano Micro-CR Bar Pattern Phantom

The nano Micro-CR Bar Pattern Phantom is specifically designed for evaluating and calibrating the spatial resolution performance of micro-computed tomography (microCT) systems. Featuring ultra-fine bar patterns etched at micron and sub-micron scales, this phantom enables detailed assessment of system sharpness, contrast resolution, and imaging fidelity. It is ideal for validating high-resolution imaging protocols, optimizing scanner settings, and benchmarking system performance over time. Constructed from materials with well-characterized X-ray attenuation properties, the phantom provides consistent, reproducible results across a wide range of energy levels and scan conditions. Its compact design allows for easy integration into standard microCT holders, making it a valuable tool for quality assurance in preclinical imaging, materials science, and nanotechnology research.